Agilent 1200 DAD

Produktinformationen "Agilent 1200 DAD"
Detector type1024-element diode array
Light sourceDeuterium and tungsten lamp
Short-term noise< ± 0.8 x 10 -5 AU at 254 nm and at 750 nm
Drift< 0.9 x 10 -3 AU/hr, at 254 nm
Linearity>2 AU upper limit
Wavelength range190-950 nm
Wavelength accuracy± 1 nm, self-calibration with deuterium lines, verification with holmium oxide filter
Slit widthProgrammable: 1, 2, 4, 8, 16 nm
Diode width< 1 nm
Wavelength bunchingProgrammable, 2 - 400 nm, in steps of 1 nm
Flow cells
Standard13-µL volume, 10 mm cell path length, 120 bar (1760 psi) pressure maximum
Semi-micro5-µL volume, 6 mm cell path length, 120 bar (1760 psi) pressure maximum
Micro2-µL volume, 3 mm cell path length, 400 bar (5880 psi) pressure maximum
Semi-nano500-nanoliter volume 10-mm cell path length, 50 bar (735 psi) pressure maximum
Nano80 nanoliter volume., 6-mm cell path length, 50 bar (735 psi) pressure maximum
Preparative3-mm cell path length, 120 bar (1760 psi) pressur maximum
0.3-mm cell path lenght, 20 bar (294 psi) pressure maximum, quartz
0.06-mm cell path length, 20 bar (294 psi) pressure maximum, quartz
High pressure1.7-µL volume, 6-mm cell path length, 400 bar (5880 psi) pressure maximum
Time programmableWavelength, polarity, peak width, lamp bandwidth, autobalance,
WL range, threshold, spectra storage mode
Spectral toolsData analysis software for spectra evaluation, including spectral libraries and peak purity functions
Analog outputRecorder/integrator 100 mV or 1 V, 2 outputs
GLPData recovery card to prevent data losses. RFID for electronics records of flow cell and UV lamp conditions (path length, volume, product number, serial number, test passed, usage). Electronic records of maintenance and errors. Early maintenance feedback (EMF) for continuous tracking of instrument usage, display of feedback messages if preset limits are exceeded. Verification of wavelength accuracy with built-in holmium oxide filter.